IEEE-EIC 2025: OFIL Unveils New Research on PD Mechanisms and Material Aging
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OFIL is proud to announce its significant contribution to the 2025 IEEE Electrical Insulation Conference (EIC), held in June 2025. This prestigious event featured our latest research paper titled “Aging of Components due to Partial Discharge Degradation Mechanisms.” Authored by Nancy Frost, PhD, Eran Frisch, and Sheyna Reizes, the paper explores the critical issue of partial discharge and its impact on dielectric materials.
Paper Overview
Our research investigates the effects of partial discharges on dielectric materials, focusing on both chemical and mechanical degradation mechanisms. The study highlights how PD activity leads to molecular bond breaking, microscopic mechanical cracks, and chemical interactions that accelerate material aging. By understanding these mechanisms, we aim to provide insights into improving the longevity and reliability of electrical insulation systems. The paper also explores the impact of environmental factors, such as moisture and contaminants, on PD-induced degradation.
Meet the Authors
Nancy Frost, PhD: Nancy is a renowned expert in the field of electrical insulation and partial discharge. She holds a PhD from Clarkson University and has extensive experience in accelerated aging of outdoor insulators. Nancy’s work has been instrumental in understanding the chemical and mechanical effects of PD on dielectric materials. She is the founder of Frosty’s Zap Lab LLC in Albany, NY, USA.
Eran Frisch: Eran is serving as the CTO at OFIL. With a strong background in physics and electro-optics engineering, Eran has been pivotal in advancing our understanding of PD and its impact on electrical insulation systems. His expertise and dedication have significantly contributed to the development of innovative solutions for PD detection and mitigation.
Sheyna Reizes: Sheyna is serving as VP Product at OFIL. Her work focuses on the practical applications of PD research, ensuring that our findings translate into real-world solutions. Sheyna’s contributions have been vital in bridging the gap between theoretical research and practical implementation.
Read the full article:
IEEE EIC Aging of Components Due to Partial Discharge Degradation Mechanisms
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